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Title: Ballistic rectification of vortex domain wall chirality at nanowire corners

The interactions of vortex domain walls with corners in planar magnetic nanowires are probed using magnetic soft X-ray transmission microscopy. We show that when the domain walls are propagated into sharp corners using applied magnetic fields above a critical value, their chiralities are rectified to either clockwise or anticlockwise circulation depending on whether the corners turn left or right. Single-shot focused magneto-optic Kerr effect measurements are then used to demonstrate how, when combined with modes of domain propagation that conserve vortex chirality, this allows us to dramatically reduce the stochasticity of domain pinning at artificial defect sites. Our results provide a tool for controlling domain wall chirality and pinning behavior both in further experimental studies and in future domain wall-based memory, logic and sensor technologies.
Authors:
; ; ; ;  [1] ; ;  [2] ;  [3] ;  [4] ;  [5] ;  [6]
  1. Department of Materials Science and Engineering, University of Sheffield, Sheffield S1 3JD (United Kingdom)
  2. School of Electronic and Electrical Engineering, University of Leeds, Leeds LS2 9JT (United Kingdom)
  3. Center for X-Ray Optics, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)
  4. (Korea, Republic of)
  5. Materials Sciences Division, Lawrence Berkley National Laboratory, Berkeley, California 94720 (United States)
  6. (United States)
Publication Date:
OSTI Identifier:
22486157
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 107; Journal Issue: 22; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; CHIRALITY; KERR EFFECT; MAGNETIC FIELDS; MICROSCOPY; NANOWIRES; PROBES; SENSORS; SOFT X RADIATION; TRANSMISSION; WALLS