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Title: Atomic motion of resonantly vibrating quartz crystal visualized by time-resolved X-ray diffraction

Transient atomic displacements during a resonant thickness-shear vibration of AT-cut α-quartz are revealed by time-resolved X-ray diffraction under an alternating electric field. The lattice strain resonantly amplified by the alternating electric field is ∼10{sup 4} times larger than that induced by a static electric field. The resonantly amplified lattice strain is achieved by fast displacements of oxygen anions and collateral resilient deformation of Si−O−Si angles bridging rigid SiO{sub 4} tetrahedra, which efficiently transduce electric energy into elastic energy.
Authors:
 [1] ; ; ;  [2] ; ; ;  [3]
  1. Department of Information and Basic Science, Nagoya City University, Nagoya 467-8501 (Japan)
  2. SPring-8/JASRI, Sayo, Hyogo 679-5198 (Japan)
  3. Graduate School of Science, Hiroshima University, Higashihiroshima, Hiroshima 739-8526 (Japan)
Publication Date:
OSTI Identifier:
22486087
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 107; Journal Issue: 20; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ANIONS; ATOMIC DISPLACEMENTS; CRYSTALS; ELECTRIC FIELDS; OXYGEN; QUARTZ; SHEAR; SILICATES; SILICON OXIDES; STRAINS; THICKNESS; TIME RESOLUTION; X-RAY DIFFRACTION