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Title: Moving antiphase boundaries using an external electric field

Antiphase boundaries (APBs) are unique domain walls that may demonstrate switchable polarization in otherwise non-ferroelectric materials such as SrTiO{sub 3} and PbZrO{sub 3}. The current study explores the possibility of displacing such domain walls at the nanoscale. We suggest the possibility of manipulating APBs using the inhomogeneous electric field of an Atomic Force Microscopy (AFM) tip with an applied voltage placed in their proximity. The displacement is studied as a function of applied voltage, film thickness, and initial separation of the AFM tip from the APB. It is established, for example, that for films with thickness of 15 nm, an APB may be attracted under the tip with a voltage of 25 V from initial separation of 30 nm. We have also demonstrated that the displacement is appreciably retained after the voltage is removed, rendering it favorable for potential applications.
Authors:
; ; ;  [1] ;  [1] ;  [2]
  1. Ceramics Laboratory, Swiss Federal Institute of Technology (EPFL), CH-1015 Lausanne (Switzerland)
  2. (Russian Federation)
Publication Date:
OSTI Identifier:
22486057
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 107; Journal Issue: 19; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; ELECTRIC POTENTIAL; FERROELECTRIC MATERIALS; FILMS; NANOSTRUCTURES; POLARIZATION; THICKNESS