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Title: Domain formation and polarization reversal under atomic force microscopy-tip voltages in ion-sliced LiNbO{sub 3} films on SiO{sub 2}/LiNbO{sub 3} substrates

We report on studies on writing of micro- and nanodomains and specified domain patterns by AFM-tip voltages U{sub DC} in thin (0.5 μm thick) ion-sliced LiNbO{sub 3} films embedded to SiO{sub 2}/LiNbO{sub 3} substrates. A peculiar feature is an overlapping of domains as the distance between them decreases. Piezoelectric hysteresis loops were measured in a wide range of U{sub DC} pulse durations. Domain dynamics and characteristics of hysteresis loops reveal marked distinctions from those observed so far in LiNbO{sub 3} films and bulk crystals.
Authors:
;  [1] ;  [2]
  1. Shubnikov Institute of Crystallography RAS, 119333 Moscow (Russian Federation)
  2. Jinan Jingzheng Electronics Co., Ltd., 250101 Jinan (China)
Publication Date:
OSTI Identifier:
22485940
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 107; Journal Issue: 16; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ATOMIC FORCE MICROSCOPY; CRYSTALS; ELECTRIC POTENTIAL; FILMS; HYSTERESIS; LITHIUM COMPOUNDS; NIOBATES; NIOBIUM OXIDES; PIEZOELECTRICITY; POLARIZATION; PULSES; SILICA; SILICON OXIDES; SUBSTRATES