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Title: Versatile atomic force microscopy setup combined with micro-focused X-ray beam

Micro-focused X-ray beams produced by third generation synchrotron sources offer new perspective of studying strains and processes at nanoscale. Atomic force microscope setup combined with a micro-focused synchrotron beam allows precise positioning and nanomanipulation of nanostructures under illumination. In this paper, we report on integration of a portable commercial atomic force microscope setup into a hard X-ray synchrotron beamline. Details of design, sample alignment procedure, and performance of the setup are presented.
Authors:
; ; ;  [1] ; ; ;  [2]
  1. Institut für Angewandte Physik und Zentrum für Mikrostrukturforschung, Jungiusstraße 11, D-20355 Hamburg (Germany)
  2. DESY Photon Science, Notkestraße 85, 22607 Hamburg (Germany)
Publication Date:
OSTI Identifier:
22483249
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 86; Journal Issue: 6; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ALIGNMENT; ATOMIC FORCE MICROSCOPY; BEAMS; DESIGN; HARD X RADIATION; ILLUMINANCE; NANOSTRUCTURES; PERFORMANCE; POSITIONING; STRAINS; SYNCHROTRON RADIATION SOURCES; SYNCHROTRONS