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Title: Versatile atomic force microscopy setup combined with micro-focused X-ray beam

Abstract

Micro-focused X-ray beams produced by third generation synchrotron sources offer new perspective of studying strains and processes at nanoscale. Atomic force microscope setup combined with a micro-focused synchrotron beam allows precise positioning and nanomanipulation of nanostructures under illumination. In this paper, we report on integration of a portable commercial atomic force microscope setup into a hard X-ray synchrotron beamline. Details of design, sample alignment procedure, and performance of the setup are presented.

Authors:
; ;  [1]; ;  [2]
  1. Institut für Angewandte Physik und Zentrum für Mikrostrukturforschung, Jungiusstraße 11, D-20355 Hamburg (Germany)
  2. DESY Photon Science, Notkestraße 85, 22607 Hamburg (Germany)
Publication Date:
OSTI Identifier:
22483249
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 86; Journal Issue: 6; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ALIGNMENT; ATOMIC FORCE MICROSCOPY; BEAMS; DESIGN; HARD X RADIATION; ILLUMINANCE; NANOSTRUCTURES; PERFORMANCE; POSITIONING; STRAINS; SYNCHROTRON RADIATION SOURCES; SYNCHROTRONS

Citation Formats

Slobodskyy, T., E-mail: Taras.Slobodskyy@physik.uni-hamburg.de, Tholapi, R., Liefeith, L., Hansen, W., Zozulya, A. V., E-mail: alexey.zozulya@desy.de, Fester, M., and Sprung, M. Versatile atomic force microscopy setup combined with micro-focused X-ray beam. United States: N. p., 2015. Web. doi:10.1063/1.4922605.
Slobodskyy, T., E-mail: Taras.Slobodskyy@physik.uni-hamburg.de, Tholapi, R., Liefeith, L., Hansen, W., Zozulya, A. V., E-mail: alexey.zozulya@desy.de, Fester, M., & Sprung, M. Versatile atomic force microscopy setup combined with micro-focused X-ray beam. United States. https://doi.org/10.1063/1.4922605
Slobodskyy, T., E-mail: Taras.Slobodskyy@physik.uni-hamburg.de, Tholapi, R., Liefeith, L., Hansen, W., Zozulya, A. V., E-mail: alexey.zozulya@desy.de, Fester, M., and Sprung, M. 2015. "Versatile atomic force microscopy setup combined with micro-focused X-ray beam". United States. https://doi.org/10.1063/1.4922605.
@article{osti_22483249,
title = {Versatile atomic force microscopy setup combined with micro-focused X-ray beam},
author = {Slobodskyy, T., E-mail: Taras.Slobodskyy@physik.uni-hamburg.de and Tholapi, R. and Liefeith, L. and Hansen, W. and Zozulya, A. V., E-mail: alexey.zozulya@desy.de and Fester, M. and Sprung, M.},
abstractNote = {Micro-focused X-ray beams produced by third generation synchrotron sources offer new perspective of studying strains and processes at nanoscale. Atomic force microscope setup combined with a micro-focused synchrotron beam allows precise positioning and nanomanipulation of nanostructures under illumination. In this paper, we report on integration of a portable commercial atomic force microscope setup into a hard X-ray synchrotron beamline. Details of design, sample alignment procedure, and performance of the setup are presented.},
doi = {10.1063/1.4922605},
url = {https://www.osti.gov/biblio/22483249}, journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 6,
volume = 86,
place = {United States},
year = {Mon Jun 15 00:00:00 EDT 2015},
month = {Mon Jun 15 00:00:00 EDT 2015}
}