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Title: Development of a pepper-pot emittance meter for diagnostics of low-energy multiply charged heavy ion beams extracted from an ECR ion source

Several fluorescent materials were tested for use in the imaging screen of a pepper-pot emittance meter that is suitable for investigating the beam dynamics of multiply charged heavy ions extracted from an ECR ion source. SiO{sub 2} (quartz), KBr, Eu-doped CaF{sub 2}, and Tl-doped CsI crystals were first irradiated with 6.52-keV protons to determine the effects of radiation damage on their fluorescence emission properties. For such a low-energy proton beam, only the quartz was found to be a suitable fluorescent material, since the other materials suffered a decay in fluorescence intensity with irradiation time. Subsequently, quartz was irradiated with heavy {sup 12}C{sup 4+}, {sup 16}O{sup 4+}, and {sup 40}Ar{sup 11+} ions, but it was found that the fluorescence intensity decreased too rapidly to measure the emittance of these heavy-ion beams. These results suggest that a different energy loss mechanism occurs for heavier ions and for protons.
Authors:
; ; ;  [1] ;  [1] ;  [2] ;  [2]
  1. Nishina Center for Accelerator Based Science, RIKEN, Wako, Saitama 351-0198 (Japan)
  2. (United Kingdom)
Publication Date:
OSTI Identifier:
22483027
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 87; Journal Issue: 2; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ARGON 40; CARBON 12; CRYSTALS; DOPED MATERIALS; ECR ION SOURCES; ENERGY LOSSES; FLUORESCENCE; HEAVY IONS; IRRADIATION; KEV RANGE; METERS; OXYGEN 16; PROTON BEAMS; QUARTZ; RADIATION EFFECTS; SILICA; SILICON OXIDES