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Title: High density plasmas and new diagnostics: An overview (invited)

One of the limiting factors for the full understanding of Electron Cyclotron Resonance Ion Sources (ECRISs) fundamental mechanisms consists of few types of diagnostic tools so far available for such compact machines. Microwave-to-plasma coupling optimisation, new methods of density overboost provided by plasma wave generation, and magnetostatic field tailoring for generating a proper electron energy distribution function, suitable for optimal ion beams formation, require diagnostic tools spanning across the entire electromagnetic spectrum from microwave interferometry to X-ray spectroscopy; these methods are going to be implemented including high resolution and spatially resolved X-ray spectroscopy made by quasi-optical methods (pin-hole cameras). The ion confinement optimisation also requires a complete control of cold electrons displacement, which can be performed by optical emission spectroscopy. Several diagnostic tools have been recently developed at INFN-LNS, including “volume-integrated” X-ray spectroscopy in low energy domain (2-30 keV, by using silicon drift detectors) or high energy regime (>30 keV, by using high purity germanium detectors). For the direct detection of the spatially resolved spectral distribution of X-rays produced by the electronic motion, a “pin-hole camera” has been developed also taking profit from previous experiences in the ECRIS field. The paper will give an overview of INFN-LNS strategy in termsmore » of new microwave-to-plasma coupling schemes and advanced diagnostics supporting the design of new ion sources and for optimizing the performances of the existing ones, with the goal of a microwave-absorption oriented design of future machines.« less
Authors:
; ;  [1]
  1. Istituto Nazionale di Fisica Nucleare—Laboratori Nazionali del Sud, Via S. Sofia 62, 95123 Catania (Italy)
Publication Date:
OSTI Identifier:
22482901
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 87; Journal Issue: 2; Other Information: (c) 2016 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ABSORPTION; ECR ION SOURCES; EMISSION SPECTROSCOPY; ENERGY SPECTRA; GE SEMICONDUCTOR DETECTORS; KEV RANGE 10-100; MICROWAVE RADIATION; OPTIMIZATION; PLASMA DENSITY; PLASMA WAVES; X RADIATION; X-RAY SPECTROSCOPY