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Title: Ion beam production with sub-milligram samples of material from an ECR source for AMS

Current accelerator mass spectrometry experiments at the Argonne Tandem Linac Accelerator System facility at Argonne National Laboratory push us to improve the ion source performance with a large number of samples and a need to minimize cross contamination. These experiments can require the creation of ion beams from as little as a few micrograms of material. These low concentration samples push the limit of our current efficiency and stability capabilities of the electron cyclotron resonance ion source. A combination of laser ablation and sputtering techniques coupled with a newly modified multi-sample changer has been used to meet this demand. We will discuss performance, stability, and consumption rates as well as planned improvements.
Authors:
; ; ;  [1] ;  [1] ;  [2]
  1. Argonne Tandem Linac Accelerator System (ATLAS), Argonne National Laboratory, Lemont, Illinois 60439 (United States)
  2. (United States)
Publication Date:
OSTI Identifier:
22482891
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 87; Journal Issue: 2; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ECR ION SOURCES; ELECTRON CYCLOTRON-RESONANCE; ION BEAMS; LASERS; LINEAR ACCELERATORS; MASS SPECTROSCOPY; PERFORMANCE; SAMPLE CHANGERS; SPUTTERING; STABILITY