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Title: A tandem time–of–flight spectrometer for negative–ion/positive–ion coincidence measurements with soft x-ray excitation

We present a newly constructed spectrometer for negative–ion/positive–ion coincidence spectroscopy of gaseous samples. The instrument consists of two time–of–flight ion spectrometers and a magnetic momentum filter for deflection of electrons. The instrument can measure double and triple coincidences between mass–resolved negative and positive ions with high detection efficiency. First results include identification of several negative–ion/positive–ion coincidence channels following inner-shell photoexcitation of sulfur hexafluoride (SF{sub 6})
Authors:
; ;  [1] ;  [2] ;  [3] ;  [4]
  1. MAX IV Laboratory, Lund University, P.O. Box 118, 22100 Lund (Sweden)
  2. Consiglio Nazionale delle Ricerche—Istituto Officina dei Materiali, Laboratorio TASC, 34149 Trieste (Italy)
  3. Elettra–Sincrotrone Trieste, Area Science Park, 34149 Trieste (Italy)
  4. Consiglio Nazionale delle Ricerche—Istituto di Struttura della Materia, 34149 Trieste (Italy)
Publication Date:
OSTI Identifier:
22482813
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 87; Journal Issue: 1; Other Information: (c) 2016 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; CATIONS; DETECTION; EFFICIENCY; EXCITATION; FILTERS; SOFT X RADIATION; SPECTROMETERS; SPECTROSCOPY; SULFUR FLUORIDES