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Title: Steady-state photoluminescent excitation characterization of semiconductor carrier recombination

Photoluminescence excitation spectroscopy is a contactless characterization technique that can provide valuable information about the surface and bulk recombination parameters of a semiconductor device, distinct from other sorts of photoluminescent measurements. For this technique, a temperature-tuned light emitting diode (LED) has several advantages over other light sources. The large radiation density offered by LEDs from near-infrared to ultraviolet region at a low cost enables efficient and fast photoluminescence measurements. A simple and inexpensive LED-based setup facilitates measurement of surface recombination velocity and bulk Shockley-Read-Hall lifetime, which are key parameters to assess device performance. Under the right conditions, this technique can also provide a contactless way to measure the external quantum efficiency of a solar cell.
Authors:
 [1] ;  [2] ; ; ; ;  [3]
  1. Intel Corporation, Hillsboro, Oregon 97124 (United States)
  2. (United States)
  3. Department of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana 47907 (United States)
Publication Date:
OSTI Identifier:
22482809
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 87; Journal Issue: 1; Other Information: (c) 2016 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; CARRIERS; EXCITATION; LIGHT EMITTING DIODES; LIGHT SOURCES; PHOTOLUMINESCENCE; QUANTUM EFFICIENCY; RECOMBINATION; SEMICONDUCTOR MATERIALS; SOLAR CELLS; SPECTROSCOPY; STEADY-STATE CONDITIONS; SURFACES; ULTRAVIOLET RADIATION