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Title: Scanning nonlinear dielectric potentiometry

Measuring spontaneous polarization and permanent dipoles on surfaces and interfaces on the nanoscale is difficult because the induced electrostatic fields and potentials are often influenced by other phenomena such as the existence of monopole fixed charges, screening charges, and contact potential differences. A method based on tip-sample capacitance detection and bias feedback is proposed which is only sensitive to polarization- or dipole-induced potentials, unlike Kelvin probe force microscopy. The feasibility of this method was demonstrated by simultaneously measuring topography and polarization-induced potentials on a reconstructed Si(111)-(7 × 7) surface with atomic resolution.
Authors:
;  [1]
  1. Research Institute of Electrical Communication, Tohoku University, 2-1-1, Katahira, Aoba, Sendai 980-8577 (Japan)
Publication Date:
OSTI Identifier:
22482782
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 86; Journal Issue: 9; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; CAPACITANCE; DETECTION; DIELECTRIC MATERIALS; DIPOLES; FEEDBACK; INTERFACES; MICROSCOPY; NANOSTRUCTURES; NONLINEAR PROBLEMS; POLARIZATION; POTENTIALS; POTENTIOMETRY; PROBES; RESOLUTION; SCREENING; SURFACES; TOPOGRAPHY