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Title: Electric field stimulation setup for photoemission electron microscopes

Manipulating magnetisation by the application of an electric field in magnetoelectric multiferroics represents a timely issue due to the potential applications in low power electronics and the novel physics involved. Thanks to its element sensitivity and high spatial resolution, X-ray photoemission electron microscopy is a uniquely suited technique for the investigation of magnetoelectric coupling in multiferroic materials. In this work, we present a setup that allows for the application of in situ electric and magnetic fields while the sample is analysed in the microscope. As an example of the performances of the setup, we present measurements on Ni/Pb(Mg{sub 0.66}Nb{sub 0.33})O{sub 3}-PbTiO{sub 3} and La{sub 0.7}Sr{sub 0.3}MnO{sub 3}/PMN-PT artificial multiferroic nanostructures.
Authors:
; ; ;  [1]
  1. Paul Scherrer Institut, 5232 Villigen PSI (Switzerland)
Publication Date:
OSTI Identifier:
22482743
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 86; Journal Issue: 8; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ELECTRIC FIELDS; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPES; MAGNETIC FIELDS; MAGNETIC PROPERTIES; MAGNETIZATION; MATERIALS; NANOSTRUCTURES; PHOTOEMISSION; SPATIAL RESOLUTION; X RADIATION