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Title: High pressure Laue diffraction and its application to study microstructural changes during the α → β phase transition in Si

An approach using polychromatic x-ray Laue diffraction is described for studying pressure induced microstructural changes of materials under pressure. The advantages of this approach with respect to application of monochromatic x-ray diffraction and other techniques are discussed. Experiments to demonstrate the applications of the method have been performed on the α → β phase transition in Si at high pressures using a diamond anvil cell. We present the characterization of microstructures across the α–β phase transition, such as morphology of both the parent and product phases, relative orientation of single-crystals, and deviatoric strains. Subtle inhomogeneous strain of the single-crystal sample caused by lattice rotations becomes detectable with the approach.
Authors:
; ; ;  [1]
  1. High Pressure Collaborative Access Team, Geophysical Laboratory, Carnegie Institution of Washington, Argonne, Illinois 60439 (United States)
Publication Date:
OSTI Identifier:
22482692
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 86; Journal Issue: 7; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; DIAMONDS; MATERIALS; MICROSTRUCTURE; MONOCHROMATIC RADIATION; MONOCRYSTALS; MORPHOLOGY; ORIENTATION; PHASE TRANSFORMATIONS; ROTATION; STRAINS; X RADIATION; X-RAY DIFFRACTION