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Title: A device for the application of uniaxial strain to single crystal samples for use in synchrotron radiation experiments

We present the design, construction, and testing of a straining device compatible with many different synchrotron radiation techniques, in a wide range of experimental environments (including low temperature, high field and ultra-high vacuum). The device has been tested by X-ray diffraction on single crystal samples of quasi-one-dimensional Cs{sub 2}Mo{sub 6}Se{sub 6} and K{sub 2}Mo{sub 6}Se{sub 6}, in which microscopic strains up to a Δc/c = 0.12% ± 0.01% change in the c lattice parameters have been achieved. We have also used the device in an inelastic X-ray scattering experiment, to probe the strain-dependent speed of sound ν along the c axis. A reduction Δν/ν of up to −3.8% was obtained at a strain of Δc/c = 0.25% in K{sub 2}Mo{sub 6}Se{sub 6}.
Authors:
 [1] ;  [2] ;  [3] ;  [3] ;  [4] ; ;  [5] ;  [6]
  1. Clarendon Laboratory, University of Oxford Physics Department, Parks Road, Oxford OX1 3PU (United Kingdom)
  2. (United Kingdom)
  3. European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble Cedex (France)
  4. (Russian Federation)
  5. Diamond Light Source, Harwell Science and Innovation Campus, Didcot OX11 ODE (United Kingdom)
  6. DPMC-MaNEP, Université de Genève, Quai Ernest-Ansermet 24, 1211 Genève 4 (Switzerland)
Publication Date:
OSTI Identifier:
22482568
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 86; Journal Issue: 10; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; DESIGN; EQUIPMENT; LATTICE PARAMETERS; MONOCRYSTALS; STRAINS; SYNCHROTRON RADIATION; X-RAY DIFFRACTION