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Title: Simultaneous dynamic electrical and structural measurements of functional materials

A new materials characterization system developed at the XMaS beamline, located at the European Synchrotron Radiation Facility in France, is presented. We show that this new capability allows to measure the atomic structural evolution (crystallography) of piezoelectric materials whilst simultaneously measuring the overall strain characteristics and electrical response to dynamically (ac) applied external stimuli.
Authors:
; ; ;  [1] ; ; ; ; ; ;  [2] ;  [3] ;  [1] ;  [3] ; ;  [2] ;  [3] ;  [4] ;  [5] ;  [1] ;  [3]
  1. National Physical Laboratory, Hampton Road, Teddington TW11 0LW (United Kingdom)
  2. XMaS, The UK-CRG, ESRF-The European Synchrotron, CS40220, F-38043, Grenoble Cedex 09 (France)
  3. (United Kingdom)
  4. ESRF-The European Synchrotron, CS40220, F-38043, Grenoble Cedex 09 (France)
  5. SIOS Meßtechnik GmbH, Am Vogelherd 46, 98693 Ilmenau (Germany)
Publication Date:
OSTI Identifier:
22482567
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 86; Journal Issue: 10; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; CRYSTALLOGRAPHY; EUROPEAN SYNCHROTRON RADIATION FACILITY; MATERIALS; PIEZOELECTRICITY; STRAINS