Simultaneous dynamic electrical and structural measurements of functional materials

Journal Article · Thu Oct 15 00:00:00 EDT 2015 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4931992· OSTI ID:22482567

Vecchini, C.; Stewart, M.; Muñiz-Piniella, A.; Wooldridge, J. ^[1]; Thompson, P.; McMitchell, S. R. C.; Bouchenoire, L.; Brown, S.; Wermeille, D.; Lucas, C. A. ^[2]; Lepadatu, S. ^[1]; Bikondoa, O.; Hase, T. P. A. ^[2]; Lesourd, M. ^[3]; Dontsov, D. ^[4]; Cain, M. G. ^[1]

---

1. National Physical Laboratory, Hampton Road, Teddington TW11 0LW (United Kingdom)
2. XMaS, The UK-CRG, ESRF-The European Synchrotron, CS40220, F-38043, Grenoble Cedex 09 (France)
3. ESRF-The European Synchrotron, CS40220, F-38043, Grenoble Cedex 09 (France)
4. SIOS Meßtechnik GmbH, Am Vogelherd 46, 98693 Ilmenau (Germany)

A new materials characterization system developed at the XMaS beamline, located at the European Synchrotron Radiation Facility in France, is presented. We show that this new capability allows to measure the atomic structural evolution (crystallography) of piezoelectric materials whilst simultaneously measuring the overall strain characteristics and electrical response to dynamically (ac) applied external stimuli.

• OSTI ID: 22482567
• Journal Information: Review of Scientific Instruments, Vol. 86, Issue 10; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CRYSTALLOGRAPHY
EUROPEAN SYNCHROTRON RADIATION FACILITY
MATERIALS
PIEZOELECTRICITY
STRAINS