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Title: Spherical quartz crystals investigated with synchrotron radiation

The quality of x-ray spectra and images obtained from plasmas with spherically bent crystals depends in part on the crystal’s x-ray diffraction across the entire crystal surface. We employ the energy selectivity and high intensity of synchrotron radiation to examine typical spherical crystals from alpha-quartz for their diffraction quality, in a perpendicular geometry that is particularly convenient to examine sagittal focusing. The crystal’s local diffraction is not ideal: the most noticeable problems come from isolated regions that so far have failed to correlate with visible imperfections. Excluding diffraction from such problem spots has little effect on the focus beyond a decrease in background.
Authors:
 [1] ;  [2] ;  [3] ;  [4] ; ;  [5]
  1. Ecopulse, Inc., 7844 Vervain Ct., Springfield, Virginia 22152 (United States)
  2. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
  3. Princeton Plasma Physics Laboratory, Princeton, New Jersey 08536 (United States)
  4. Kurchatov Institute, Moscow (Russian Federation)
  5. The Ohio State University, Columbus, Ohio 43210 (United States)
Publication Date:
OSTI Identifier:
22482566
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 86; Journal Issue: 10; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; CRYSTALS; DEFECTS; FOCUSING; GEOMETRY; IMAGES; PLASMA; QUARTZ; SPHERICAL CONFIGURATION; SURFACES; SYNCHROTRON RADIATION; X-RAY DIFFRACTION; X-RAY SPECTRA