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Title: Thickness dependence of La{sub 0.7}Sr{sub 0.3}MnO{sub 3}/PbZr{sub 0.2}Ti{sub 0.8}O{sub 3} magnetoelectric interfaces

Magnetoelectric materials have great potential to revolutionize electronic devices due to the coupling of their electric and magnetic properties. Thickness varying La{sub 0.7}Sr{sub 0.3}MnO{sub 3} (LSMO)/PbZr{sub 0.2}Ti{sub 0.8}O{sub 3} (PZT) heterostructures were built and measured in this article by valence sensitive x-ray absorption spectroscopy. The sizing effects of the heterostructures on the LSMO/PZT magnetoelectric interfaces were investigated through the behavior of Mn valence, a property associated with the LSMO magnetization. We found that Mn valence increases with both LSMO and PZT thickness. Piezoresponse force microscopy revealed a transition from monodomain to polydomain structure along the PZT thickness gradient. The ferroelectric surface charge may change with domain structure and its effects on Mn valence were simulated using a two-orbital double-exchange model. The screening of ferroelectric surface charge increases the electron charges in the interface region, and greatly changes the interfacial Mn valence, which likely plays a leading role in the interfacial magnetoelectric coupling. The LSMO thickness dependence was examined through the combination of two detection modes with drastically different attenuation depths. The different length scales of these techniques' sensitivity to the atomic valence were used to estimate the depth dependence Mn valence. A smaller interfacial Mn valence than the bulk wasmore » found by globally fitting the experimental results.« less
Authors:
; ; ; ;  [1] ; ;  [2] ;  [3] ; ;  [4] ;  [5] ;  [1] ;  [6] ;  [7] ;  [8] ;  [9]
  1. Department of Physics and Astronomy, West Virginia University, Morgantown, West Virginia 26506 (United States)
  2. Institute of Physics, National Chiao Tung University, 30010 Hsinchu, Taiwan (China)
  3. Department of Physics, Southeast University, 211189 Nanjing (China)
  4. Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)
  5. National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)
  6. (United States)
  7. Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina 27695 (United States)
  8. Department of Materials Science and Engineering, National Chiao Tung University, 30010 Hsinchu, Taiwan (China)
  9. (China)
Publication Date:
OSTI Identifier:
22482197
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 107; Journal Issue: 14; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ABSORPTION SPECTROSCOPY; ATTENUATION; DEPTH; DETECTION; DOMAIN STRUCTURE; ELECTRICAL PROPERTIES; ELECTRONIC EQUIPMENT; FERROELECTRIC MATERIALS; INTERFACES; MAGNETIC PROPERTIES; MAGNETIZATION; MICROSCOPY; PZT; SENSITIVITY; SIMULATION; SIZE; THICKNESS; VALENCE; X-RAY SPECTROSCOPY