Rapid, all-optical crystal orientation imaging of two-dimensional transition metal dichalcogenide monolayers

David, Sabrina N.; Zhai, Yao; Zande, Arend M. van der; O'Brien, Kevin; Huang, Pinshane Y.; Chenet, Daniel A.; Hone, James C.; Zhang, Xiang; Yin, Xiaobo

doi:10.1063/1.4930232

Title: Rapid, all-optical crystal orientation imaging of two-dimensional transition metal dichalcogenide monolayers

Journal Article · Mon Sep 14 00:00:00 EDT 2015 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4930232· OSTI ID:22482076

David, Sabrina N. ^[1]; Zhai, Yao ^[2]; Zande, Arend M. van der ^[3]; O'Brien, Kevin ^[4]; Huang, Pinshane Y. ^[5]; Chenet, Daniel A.; Hone, James C. ^[3]; Zhang, Xiang ^[4]; Yin, Xiaobo ^[1]

Materials Science and Engineering Program, University of Colorado, Boulder, Colorado 80309 (United States)
Department of Mechanical Engineering, University of Colorado, Boulder, Colorado 80309 (United States)
Department of Mechanical Engineering, Columbia University, New York, New York 10027 (United States)
NSF Nanoscale Science and Engineering Center (NSEC), University of California, Berkeley 3112 Etcheverry Hall, UC Berkeley, California 94720 (United States)
Department of Mechanical Science and Engineering, University of Illinois, Urbana, Illinois 61801 (United States)

Two-dimensional (2D) atomic materials such as graphene and transition metal dichalcogenides (TMDCs) have attracted significant research and industrial interest for their electronic, optical, mechanical, and thermal properties. While large-area crystal growth techniques such as chemical vapor deposition have been demonstrated, the presence of grain boundaries and orientation of grains arising in such growths substantially affect the physical properties of the materials. There is currently no scalable characterization method for determining these boundaries and orientations over a large sample area. We here present a second-harmonic generation based microscopy technique for rapidly mapping grain orientations and boundaries of 2D TMDCs. We experimentally demonstrate the capability to map large samples to an angular resolution of ±1° with minimal sample preparation and without involved analysis. A direct comparison of the all-optical grain orientation maps against results obtained by diffraction-filtered dark-field transmission electron microscopy plus selected-area electron diffraction on identical TMDC samples is provided. This rapid and accurate tool should enable large-area characterization of TMDC samples for expedited studies of grain boundary effects and the efficient characterization of industrial-scale production techniques.

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OSTI ID:: 22482076

Journal Information:: Applied Physics Letters, Vol. 107, Issue 11; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951

Country of Publication:: United States

Language:: English

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