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Title: Rapid, all-optical crystal orientation imaging of two-dimensional transition metal dichalcogenide monolayers

Abstract

Two-dimensional (2D) atomic materials such as graphene and transition metal dichalcogenides (TMDCs) have attracted significant research and industrial interest for their electronic, optical, mechanical, and thermal properties. While large-area crystal growth techniques such as chemical vapor deposition have been demonstrated, the presence of grain boundaries and orientation of grains arising in such growths substantially affect the physical properties of the materials. There is currently no scalable characterization method for determining these boundaries and orientations over a large sample area. We here present a second-harmonic generation based microscopy technique for rapidly mapping grain orientations and boundaries of 2D TMDCs. We experimentally demonstrate the capability to map large samples to an angular resolution of ±1° with minimal sample preparation and without involved analysis. A direct comparison of the all-optical grain orientation maps against results obtained by diffraction-filtered dark-field transmission electron microscopy plus selected-area electron diffraction on identical TMDC samples is provided. This rapid and accurate tool should enable large-area characterization of TMDC samples for expedited studies of grain boundary effects and the efficient characterization of industrial-scale production techniques.

Authors:
 [1];  [2];  [3];  [4];  [5]; ;  [3];  [4];  [1]
  1. Materials Science and Engineering Program, University of Colorado, Boulder, Colorado 80309 (United States)
  2. Department of Mechanical Engineering, University of Colorado, Boulder, Colorado 80309 (United States)
  3. Department of Mechanical Engineering, Columbia University, New York, New York 10027 (United States)
  4. NSF Nanoscale Science and Engineering Center (NSEC), University of California, Berkeley 3112 Etcheverry Hall, UC Berkeley, California 94720 (United States)
  5. Department of Mechanical Science and Engineering, University of Illinois, Urbana, Illinois 61801 (United States)
Publication Date:
OSTI Identifier:
22482076
Resource Type:
Journal Article
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 107; Journal Issue: 11; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0003-6951
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; CHEMICAL VAPOR DEPOSITION; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; GRAIN ORIENTATION; GRAPHENE; RESOLUTION; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENTS; TRANSMISSION ELECTRON MICROSCOPY; TWO-DIMENSIONAL SYSTEMS

Citation Formats

David, Sabrina N., Zhai, Yao, Zande, Arend M. van der, Department of Mechanical Science and Engineering, University of Illinois, Urbana, Illinois 61801, O'Brien, Kevin, Huang, Pinshane Y., Chenet, Daniel A., Hone, James C., Zhang, Xiang, Department of Physics, King Abdulaziz University, Jeddah, Materials Sciences Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, California 94720, Yin, Xiaobo, and Department of Mechanical Engineering, University of Colorado, Boulder, Colorado 80309. Rapid, all-optical crystal orientation imaging of two-dimensional transition metal dichalcogenide monolayers. United States: N. p., 2015. Web. doi:10.1063/1.4930232.
David, Sabrina N., Zhai, Yao, Zande, Arend M. van der, Department of Mechanical Science and Engineering, University of Illinois, Urbana, Illinois 61801, O'Brien, Kevin, Huang, Pinshane Y., Chenet, Daniel A., Hone, James C., Zhang, Xiang, Department of Physics, King Abdulaziz University, Jeddah, Materials Sciences Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, California 94720, Yin, Xiaobo, & Department of Mechanical Engineering, University of Colorado, Boulder, Colorado 80309. Rapid, all-optical crystal orientation imaging of two-dimensional transition metal dichalcogenide monolayers. United States. https://doi.org/10.1063/1.4930232
David, Sabrina N., Zhai, Yao, Zande, Arend M. van der, Department of Mechanical Science and Engineering, University of Illinois, Urbana, Illinois 61801, O'Brien, Kevin, Huang, Pinshane Y., Chenet, Daniel A., Hone, James C., Zhang, Xiang, Department of Physics, King Abdulaziz University, Jeddah, Materials Sciences Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, California 94720, Yin, Xiaobo, and Department of Mechanical Engineering, University of Colorado, Boulder, Colorado 80309. 2015. "Rapid, all-optical crystal orientation imaging of two-dimensional transition metal dichalcogenide monolayers". United States. https://doi.org/10.1063/1.4930232.
@article{osti_22482076,
title = {Rapid, all-optical crystal orientation imaging of two-dimensional transition metal dichalcogenide monolayers},
author = {David, Sabrina N. and Zhai, Yao and Zande, Arend M. van der and Department of Mechanical Science and Engineering, University of Illinois, Urbana, Illinois 61801 and O'Brien, Kevin and Huang, Pinshane Y. and Chenet, Daniel A. and Hone, James C. and Zhang, Xiang and Department of Physics, King Abdulaziz University, Jeddah and Materials Sciences Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, California 94720 and Yin, Xiaobo and Department of Mechanical Engineering, University of Colorado, Boulder, Colorado 80309},
abstractNote = {Two-dimensional (2D) atomic materials such as graphene and transition metal dichalcogenides (TMDCs) have attracted significant research and industrial interest for their electronic, optical, mechanical, and thermal properties. While large-area crystal growth techniques such as chemical vapor deposition have been demonstrated, the presence of grain boundaries and orientation of grains arising in such growths substantially affect the physical properties of the materials. There is currently no scalable characterization method for determining these boundaries and orientations over a large sample area. We here present a second-harmonic generation based microscopy technique for rapidly mapping grain orientations and boundaries of 2D TMDCs. We experimentally demonstrate the capability to map large samples to an angular resolution of ±1° with minimal sample preparation and without involved analysis. A direct comparison of the all-optical grain orientation maps against results obtained by diffraction-filtered dark-field transmission electron microscopy plus selected-area electron diffraction on identical TMDC samples is provided. This rapid and accurate tool should enable large-area characterization of TMDC samples for expedited studies of grain boundary effects and the efficient characterization of industrial-scale production techniques.},
doi = {10.1063/1.4930232},
url = {https://www.osti.gov/biblio/22482076}, journal = {Applied Physics Letters},
issn = {0003-6951},
number = 11,
volume = 107,
place = {United States},
year = {Mon Sep 14 00:00:00 EDT 2015},
month = {Mon Sep 14 00:00:00 EDT 2015}
}

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Works referencing / citing this record:

Plasmonic Enhancement and Manipulation of Optical Nonlinearity in Monolayer Tungsten Disulfide
journal, August 2018


Ultrahigh-resolution nonlinear optical imaging of the armchair orientation in 2D transition metal dichalcogenides
journal, January 2018


Twist Angle mapping in layered WS2 by Polarization-Resolved Second Harmonic Generation
journal, October 2019


Supercontinuum second harmonic generation spectroscopy of atomically thin semiconductors
journal, August 2019


Strain transfer across grain boundaries in MoS 2 monolayers grown by chemical vapor deposition
journal, April 2018


Controlling second-harmonic diffraction by nano-patterning MoS 2 monolayers
journal, January 2019


Twist Angle mapping in layered WS2 by Polarization-Resolved Second Harmonic Generation
preprint, January 2019


Twist Angle mapping in layered WS2 by Polarization-Resolved Second Harmonic Generation
journal, October 2019