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Title: Effects of cation stoichiometry on electronic and structural properties of LaNiO{sub 3}

LaNiO{sub 3} films with varying La:Ni ratios were deposited onto SrTiO{sub 3} (001) substrates via molecular beam epitaxy to elucidate the effects of cation off-stoichiometry. The physical properties of La-deficient films are found to differ substantially from those of Ni-deficient films, with La-deficient films exhibiting lower electrical resistivities and smaller c-axis parameters than Ni-deficient films. No evidence of secondary phases is observed; however, transmission electron microscopy reveals an abundance of defects, the nature of which differs in lanthanum- and nickel-deficient films. This work illustrates the nontrivial role that cation stoichiometry can play on the functional properties of complex oxides.
Authors:
; ; ;  [1] ;  [2]
  1. Department of Materials Science and Engineering, Drexel University, Philadelphia, Pennsylvania 19104 (United States)
  2. Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland, Washington 99352 (United States)
Publication Date:
OSTI Identifier:
22479707
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films; Journal Volume: 33; Journal Issue: 4; Other Information: (c) 2015 American Vacuum Society; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ABUNDANCE; CATIONS; DEPOSITS; ELECTRIC CONDUCTIVITY; FILMS; LANTHANUM; MOLECULAR BEAM EPITAXY; NICKEL; STOICHIOMETRY; STRONTIUM TITANATES; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY