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Title: Characterization of CdMnTe films deposited from polycrystalline powder source using closed-space sublimation method

CdMnTe films were prepared on quartz substrates by closed-space sublimation of polycrystalline Cd{sub 0.74}Mn{sub 0.26}Te powders. This was performed at different substrate temperatures (T{sub s} = 200, 300, 350, and 400 °C). The interfacial adhesion strength between the films and substrates, when fabricated from polycrystalline powders, was greater than that of films grown using a bulk source. X-ray diffraction studies revealed that the as-deposited films had a zinc blende structure with a preferential (111) orientation. Precipitation of Te occurred in the films deposited at T{sub s} = 200 °C, as confirmed using scanning electron microscopy, x-ray diffraction, and Raman spectroscopy. The growth mode and re-evaporation dependence on the value of T{sub s} of the films were investigated. Our results suggested that materials suitable for radiation detection can be grown from a powder source at lower substrate temperatures then when grown from a bulk source.
Authors:
; ; ; ; ; ; ; ; ; ;  [1]
  1. School of Materials Science and Engineering, Shanghai University, Shanghai 200444 (China)
Publication Date:
OSTI Identifier:
22479650
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films; Journal Volume: 33; Journal Issue: 5; Other Information: (c) 2015 American Vacuum Society; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; DEPOSITS; FILMS; POLYCRYSTALS; POWDERS; QUARTZ; RADIATION DETECTION; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SUBLIMATION; SUBSTRATES; X-RAY DIFFRACTION; ZINC SULFIDES