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Title: Cement paste surface roughness analysis using coherence scanning interferometry and confocal microscopy

Scanning electron microscopy and scanning probe microscopy have been used for several decades to better understand the microstructure of cementitious materials. Very limited work has been performed to date to study the roughness of cementitious materials by optical microscopy such as coherence scanning interferometry (CSI) and chromatic confocal sensing (CCS). The objective of this paper is to better understand how CSI can be used as a tool to analyze surface roughness and topography of cement pastes. Observations from a series of images acquired using this technique on both polished and unpolished samples are described. The results from CSI are compared with those from a STIL confocal microscopy technique (SCM). Comparison between both optical techniques demonstrates the ability of CSI to measure both polished and unpolished cement pastes. - Highlights: • Coherence scanning interferometry (CSI) was used to analyze cement paste surfaces. • The results from the CSI were compared with those from a confocal microscopy. • 3D roughness parameters were obtained using the window resizing method. • Polished and unpolished cement pastes were studied.
Authors:
 [1] ; ;  [2] ;  [3] ;  [2] ;  [1] ;  [2]
  1. ICube, Université de Strasbourg, CNRS, 2 rue Boussingault, 67000 Strasbourg (France)
  2. ICube, INSA de Strasbourg, CNRS, 24 Bld de la Victoire, 67084 Strasbourg (France)
  3. ICube, Université de Strasbourg, CNRS, 23 rue du Loess, 67037 Strasbourg (France)
Publication Date:
OSTI Identifier:
22476038
Resource Type:
Journal Article
Resource Relation:
Journal Name: Materials Characterization; Journal Volume: 100; Other Information: Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; INTERFEROMETRY; MICROSTRUCTURE; OPTICAL MICROSCOPY; SCANNING ELECTRON MICROSCOPY; SURFACES