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Title: Erbium-doped borosilicate glasses containing various amounts of P{sub 2}O{sub 5} and Al{sub 2}O{sub 3}: Influence of the silica content on the structure and thermal, physical, optical and luminescence properties

Highlights: • Er{sup 3+} doped borosilicate glasses were processed with different compositions and characterizations. • An increase in the SiO{sub 2} content leads to a silicate-rich environment around the Er{sup 3+} site. • An increase in the SiO{sub 2} content decreases the Er{sup 3+} absorption cross-section at 980 nm. • Glasses with 60 mol% of SiO{sub 2} exhibit a stronger emission intensity at 1530 nm than glasses with x = 50. • Highest 1.5 μm emission intensity was achieved for the Al and P containing glass with 60 mol% of SiO{sub 2}. - Abstract: The influence of the silica content on several properties of Er-doped borosilicate glasses in the presence of various amounts of P{sub 2}O{sub 5} and Al{sub 2}O{sub 3} has been investigated. The introduction of P{sub 2}O{sub 5} and/or Al{sub 2}O{sub 3} are responsible for structural modifications in the glass network through a charge-compensation mechanism related to the formation of negatively-charged PO{sub 4} and AlO{sub 4} groups or through the formation of AlPO{sub 4}-like structural units. In this paper, we show that an increase in the SiO{sub 2} content leads to a silicate-rich environment around the Er{sup 3+} site, resulting in an increased dependence of the Er{sup 3+}more » ions optical and luminescence properties on the P{sub 2}O{sub 5} and/or Al{sub 2}O{sub 3} concentration. The highest emission intensity at 1.5 μm was achieved for the glass with an equal proportion of P and Al in the glass system with 60 mol% of SiO{sub 2}.« less
Authors:
 [1] ;  [2] ;  [3] ;  [4] ;  [3] ;  [5] ; ;  [6] ; ;  [4] ; ;  [7] ;  [1]
  1. Politecnico di Torino, DISAT, Istituto di Ingegneria e Fisica dei Materiali, Corso Duca degli Abruzzi 24, I-10129 Torino (Italy)
  2. Department of Electronics and Communications Engineering, Tampere University of Technology, Korkeakoulunkatu 3, FI-33720 Tampere (Finland)
  3. (Finland)
  4. Process Chemistry Centre, Åbo Akademi University, Biskopsgatan 8, FI-20500 Turku (Finland)
  5. nLIGHT Corporation, Sorronrinne 9, FI-08500 Lohja (Finland)
  6. CNRS, Université de Bordeaux, ISM, 351 Cours de la Libération, F-33405 Talence (France)
  7. CNRS, Université de Bordeaux, ICMCB, 87 Avenue du Dr Schweitzer, F-33608 Pessac (France)
Publication Date:
OSTI Identifier:
22475888
Resource Type:
Journal Article
Resource Relation:
Journal Name: Materials Research Bulletin; Journal Volume: 70; Other Information: Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ABSORPTION SPECTROSCOPY; ALUMINIUM OXIDES; ALUMINIUM PHOSPHATES; BOROSILICATE GLASS; CROSS SECTIONS; DOPED MATERIALS; ERBIUM ADDITIONS; INFRARED SPECTRA; LUMINESCENCE; MODIFICATIONS; OPTICAL PROPERTIES; PHOSPHORUS OXIDES; PHOTOELECTRON SPECTROSCOPY; SILICATES; SILICON OXIDES