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Title: Dependence of microwave dielectric properties on crystallization behaviour of CaMgSi{sub 2}O{sub 6} glass-ceramics

The effects of the crystallization behaviour of CaMgSi{sub 2}O{sub 6} (diopside) glass-ceramics on their microwave dielectric properties were investigated as functions of the Cr{sub 2}O{sub 3} content and heat-treatment method used (one or two steps). The crystallization behaviours of the specimens were affected by the Cr{sub 2}O{sub 3} content as well as by the heat-treatment method employed, and were evaluated using X-ray diffraction and the combined Rietveld and reference intensity ratio (RIR) method. The dielectric constants (K) of the specimens did not change significantly with an increase in the Cr{sub 2}O{sub 3} content. The quality factor (Qf) of the specimens increased for Cr{sub 2}O{sub 3} contents of up to 0.5 wt% Cr{sub 2}O{sub 3}, but then decreased for higher contents. These results could be attributed to the degree of crystallization. For the same Cr{sub 2}O{sub 3} content, the specimens that underwent a two-step heat treatment showed lower K values and higher Qf values than those heat-treated in one-step. These results could be attributed to the smaller crystallite size and higher degree of crystallization in the specimens obtained from the two-step heat treatment compared with those of the specimens heat-treated in one-step method.
Authors:
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Publication Date:
OSTI Identifier:
22475826
Resource Type:
Journal Article
Resource Relation:
Journal Name: Materials Research Bulletin; Journal Volume: 67; Other Information: Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; CALCIUM COMPOUNDS; CERAMICS; CHROMIUM OXIDES; CRYSTALLIZATION; DIOPSIDE; GLASS; HEAT TREATMENTS; MAGNESIUM COMPOUNDS; MICROSTRUCTURE; MICROWAVE RADIATION; PERMITTIVITY; QUALITY FACTOR; SILICATES; X-RAY DIFFRACTION