Dependence of microwave dielectric properties on crystallization behaviour of CaMgSi{sub 2}O{sub 6} glass-ceramics
The effects of the crystallization behaviour of CaMgSi{sub 2}O{sub 6} (diopside) glass-ceramics on their microwave dielectric properties were investigated as functions of the Cr{sub 2}O{sub 3} content and heat-treatment method used (one or two steps). The crystallization behaviours of the specimens were affected by the Cr{sub 2}O{sub 3} content as well as by the heat-treatment method employed, and were evaluated using X-ray diffraction and the combined Rietveld and reference intensity ratio (RIR) method. The dielectric constants (K) of the specimens did not change significantly with an increase in the Cr{sub 2}O{sub 3} content. The quality factor (Qf) of the specimens increased for Cr{sub 2}O{sub 3} contents of up to 0.5 wt% Cr{sub 2}O{sub 3}, but then decreased for higher contents. These results could be attributed to the degree of crystallization. For the same Cr{sub 2}O{sub 3} content, the specimens that underwent a two-step heat treatment showed lower K values and higher Qf values than those heat-treated in one-step. These results could be attributed to the smaller crystallite size and higher degree of crystallization in the specimens obtained from the two-step heat treatment compared with those of the specimens heat-treated in one-step method.
- OSTI ID:
- 22475826
- Journal Information:
- Materials Research Bulletin, Vol. 67; Other Information: Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
- Country of Publication:
- United States
- Language:
- English
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