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Title: Microstructural and mechanical characteristics of Ni–Cr thin films

Abstract

Highlights: • Ni–Cr thin films of varied composition deposited by DC magnetron co-sputtering. • Thin film with Ni–Cr: 80–20 at% composition exhibits most distinct behavior. • The films were tensile tested and exhibited no cracking till the substrate yielding. - Abstract: Ni–Cr alloy thin films have been deposited using magnetron co-sputtering technique at room temperature. Crystal structure was evaluated using GIXRD. Ni–Cr solid solution upto 40 at% of Cr exhibited fcc solid solution of Cr in Ni and beyond that it exhibited bcc solid solution of Ni in Cr. X-ray diffraction analysis shows formation of (1 1 1) fiber texture in fcc and (2 2 0) fiber texture in bcc Ni–Cr thin films. Electron microscopy in both in-plane and transverse direction of the film surface revealed the presence of columnar microstructure for films having Cr upto 40 at%. Mechanical properties of the films are evaluated using nanoindentation. The modulus values increased with increase of Cr at% till the film is fcc. With further increase in Cr at% the modulus values decreased. Ni–Cr film with 20 at% Ni exhibits reduction in modulus and is correlated to the poor crystallization of the film as reflected in XRD analysis. The Ni–Cr thin filmmore » with 80 at% Ni and 20 at% Cr exhibited the most distinct columnar structure with highest electrical resistivity, indentation hardness and elastic modulus.« less

Authors:
 [1]; ; ;  [2];  [1]
  1. Gas Turbine Research Establishment, DRDO, Bangalore 93 (India)
  2. Department of Instrumentation and Applied Physics, IISc, Bangalore 12 (India)
Publication Date:
OSTI Identifier:
22475787
Resource Type:
Journal Article
Journal Name:
Materials Research Bulletin
Additional Journal Information:
Journal Volume: 66; Other Information: Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0025-5408
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; BCC LATTICES; BINARY ALLOY SYSTEMS; CHROMIUM COMPOUNDS; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; ELECTRON MICROSCOPY; FCC LATTICES; FIBERS; HARDNESS; MAGNETRONS; MICROSTRUCTURE; NICKEL COMPOUNDS; REDUCTION; SOLID SOLUTIONS; SPUTTERING; SUBSTRATES; SURFACES; THIN FILMS; X-RAY DIFFRACTION

Citation Formats

Petley, Vijay, Sathishkumar, S., Thulasi Raman, K. H., Rao, G. Mohan, and Chandrasekhar, U. Microstructural and mechanical characteristics of Ni–Cr thin films. United States: N. p., 2015. Web. doi:10.1016/J.MATERRESBULL.2015.02.002.
Petley, Vijay, Sathishkumar, S., Thulasi Raman, K. H., Rao, G. Mohan, & Chandrasekhar, U. Microstructural and mechanical characteristics of Ni–Cr thin films. United States. https://doi.org/10.1016/J.MATERRESBULL.2015.02.002
Petley, Vijay, Sathishkumar, S., Thulasi Raman, K. H., Rao, G. Mohan, and Chandrasekhar, U. 2015. "Microstructural and mechanical characteristics of Ni–Cr thin films". United States. https://doi.org/10.1016/J.MATERRESBULL.2015.02.002.
@article{osti_22475787,
title = {Microstructural and mechanical characteristics of Ni–Cr thin films},
author = {Petley, Vijay and Sathishkumar, S. and Thulasi Raman, K. H. and Rao, G. Mohan and Chandrasekhar, U.},
abstractNote = {Highlights: • Ni–Cr thin films of varied composition deposited by DC magnetron co-sputtering. • Thin film with Ni–Cr: 80–20 at% composition exhibits most distinct behavior. • The films were tensile tested and exhibited no cracking till the substrate yielding. - Abstract: Ni–Cr alloy thin films have been deposited using magnetron co-sputtering technique at room temperature. Crystal structure was evaluated using GIXRD. Ni–Cr solid solution upto 40 at% of Cr exhibited fcc solid solution of Cr in Ni and beyond that it exhibited bcc solid solution of Ni in Cr. X-ray diffraction analysis shows formation of (1 1 1) fiber texture in fcc and (2 2 0) fiber texture in bcc Ni–Cr thin films. Electron microscopy in both in-plane and transverse direction of the film surface revealed the presence of columnar microstructure for films having Cr upto 40 at%. Mechanical properties of the films are evaluated using nanoindentation. The modulus values increased with increase of Cr at% till the film is fcc. With further increase in Cr at% the modulus values decreased. Ni–Cr film with 20 at% Ni exhibits reduction in modulus and is correlated to the poor crystallization of the film as reflected in XRD analysis. The Ni–Cr thin film with 80 at% Ni and 20 at% Cr exhibited the most distinct columnar structure with highest electrical resistivity, indentation hardness and elastic modulus.},
doi = {10.1016/J.MATERRESBULL.2015.02.002},
url = {https://www.osti.gov/biblio/22475787}, journal = {Materials Research Bulletin},
issn = {0025-5408},
number = ,
volume = 66,
place = {United States},
year = {Mon Jun 15 00:00:00 EDT 2015},
month = {Mon Jun 15 00:00:00 EDT 2015}
}