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Title: Analysis of optical and magnetooptical spectra of Fe{sub 5}Si{sub 3} and Fe{sub 3}Si magnetic silicides using spectral magnetoellipsometry

The optical, magnetooptical, and magnetic properties of polycrystalline (Fe{sub 5}Si{sub 3}/SiO{sub 2}/Si(100)) and epitaxial Fe{sub 3}Si/Si(111) films are investigated by spectral magnetoellipsometry. The dispersion of the complex refractive index of Fe{sub 5}Si{sub 3} is measured using multiangle spectral ellipsometry in the range of 250–1000 nm. The dispersion of complex Voigt magnetooptical parameters Q is determined for Fe{sub 5}Si{sub 3} and Fe{sub 3}Si in the range of 1.6–4.9 eV. The spectral dependence of magnetic circular dichroism for both silicides has revealed a series of resonance peaks. The energies of the detected peaks correspond to interband electron transitions for spin-polarized densities of electron states (DOS) calculated from first principles for bulk Fe{sub 5}Si{sub 3} and Fe{sub 3}Si crystals.
Authors:
; ; ;  [1] ;  [2] ;  [1] ;  [2] ;  [1] ; ;  [3] ;  [4]
  1. Reshetnikov Siberian State Aerospace University (Russian Federation)
  2. Russian Academy of Sciences, Kirensky Institute of Physics, Siberian Branch (Russian Federation)
  3. Russian Academy of Sciences, Rzhanov Institute of Semiconductor Physics, Siberian Branch (Russian Federation)
  4. Russian Academy of Sciences, Institute for Automation and Control Processes, Far East Branch (Russian Federation)
Publication Date:
OSTI Identifier:
22472257
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Experimental and Theoretical Physics; Journal Volume: 120; Journal Issue: 5; Other Information: Copyright (c) 2015 Pleiades Publishing, Inc.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ELECTRONIC STRUCTURE; ELLIPSOMETRY; EPITAXY; EV RANGE; FILMS; IRON SILICIDES; MAGNETIC CIRCULAR DICHROISM; MAGNETIC PROPERTIES; MAGNETO-OPTICAL EFFECTS; POLYCRYSTALS; REFRACTIVE INDEX; SILICON; SILICON OXIDES; SPIN ORIENTATION