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Title: Conditions of steady switching in phase-transition memory cells

Three types of non-volatile memory cells of different designs based on phase transitions are developed and implemented. The effect of the design features of the cells and their active-region sizes on the switching characteristics and normal operation of the cells is considered as a whole. The causes of failure of the cells are analyzed from the obtained series of scanning electron images upon level-by-level etching of the samples. It is shown that the cell design is the most critical factor from the viewpoint of switching to the high-resistance state. The causes of this fact are analyzed and the criterion for providing the steady operation of cells of non-volatile memory based on phase transitions is formulated.
Authors:
; ;  [1]
  1. National Research University “Moscow Power Engineering Institute” (Russian Federation)
Publication Date:
OSTI Identifier:
22469981
Resource Type:
Journal Article
Resource Relation:
Journal Name: Semiconductors; Journal Volume: 49; Journal Issue: 4; Other Information: Copyright (c) 2015 Pleiades Publishing, Ltd.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ELECTRIC CONDUCTIVITY; ELECTRON SCANNING; ETCHING; FAILURES; IMAGE SCANNERS; MEMORY DEVICES; OPERATION; PHASE TRANSFORMATIONS; STEADY-STATE CONDITIONS; VOLATILITY