X-ray fluorescence analysis of Ge{sub 1–x}Se{sub x}, As{sub 1–x}Se{sub x}, and Ge{sub 1–x–y}As{sub y}Se{sub x} glasses using electronic excitation

Terukov, E. I.; Marchenko, A. V.; Zhilina, D. V.; Bobokhuzhaev, K. U.

doi:10.1134/S1063782615100255

Title: X-ray fluorescence analysis of Ge{sub 1–x}Se{sub x}, As{sub 1–x}Se{sub x}, and Ge{sub 1–x–y}As{sub y}Se{sub x} glasses using electronic excitation

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Abstract

X-ray fluorescence analysis with fluorescence excitation by an electron beam with an energy of 30 kV is applied to determine the germanium, arsenic, and selenium contents in Ge{sub 1–x}Se{sub x}, As{sub 1–x}Se{sub x}, and Ge{sub 1–x–y}As{sub y}Se{sub x} glassy alloys. Using calibration dependences, the quantitative composition of the glasses is determined with an accuracy of ±0.0002 for parameters x and y in a surface layer ∼0.1 µm deep.

Authors:

Terukov, E. I. ^[1]; Marchenko, A. V. ^[2]; Zhilina, D. V. ^[1]; Bobokhuzhaev, K. U. ^[3]

Russian Academy of Sciences, Ioffe Physical–Technical Institute (Russian Federation)
Alexander Herzen State Pedagogical University of Russia (Russian Federation)
Mirzo Ulug’bek National University of Uzbekistan (Uzbekistan)

Publication Date:: Thu Oct 15 00:00:00 EDT 2015

OSTI Identifier:: 22469718

Resource Type:: Journal Article

Journal Name:: Semiconductors

Additional Journal Information:: Journal Volume: 49; Journal Issue: 10; Other Information: Copyright (c) 2015 Pleiades Publishing, Ltd.; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 1063-7826

Country of Publication:: United States

Language:: English

Subject:: 36 MATERIALS SCIENCE; CALIBRATION; CONCENTRATION RATIO; ELECTRON BEAMS; EXCITATION; FLUORESCENCE; GERMANIUM ARSENIDES; GERMANIUM SELENIDES; GLASS; LAYERS; METALLIC GLASSES; SURFACES; X-RAY FLUORESCENCE ANALYSIS

Citation Formats


                    Terukov, E. I., Seregin, P. P., E-mail: ppseregin@mail.ru, Marchenko, A. V., Zhilina, D. V., and Bobokhuzhaev, K. U. X-ray fluorescence analysis of Ge{sub 1–x}Se{sub x}, As{sub 1–x}Se{sub x}, and Ge{sub 1–x–y}As{sub y}Se{sub x} glasses using electronic excitation.  United States: N. p., 2015. 
        Web.  doi:10.1134/S1063782615100255.

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                    Terukov, E. I., Seregin, P. P., E-mail: ppseregin@mail.ru, Marchenko, A. V., Zhilina, D. V., & Bobokhuzhaev, K. U. X-ray fluorescence analysis of Ge{sub 1–x}Se{sub x}, As{sub 1–x}Se{sub x}, and Ge{sub 1–x–y}As{sub y}Se{sub x} glasses using electronic excitation.  United States.  https://doi.org/10.1134/S1063782615100255

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                    Terukov, E. I., Seregin, P. P., E-mail: ppseregin@mail.ru, Marchenko, A. V., Zhilina, D. V., and Bobokhuzhaev, K. U. 2015.  
        "X-ray fluorescence analysis of Ge{sub 1–x}Se{sub x}, As{sub 1–x}Se{sub x}, and Ge{sub 1–x–y}As{sub y}Se{sub x} glasses using electronic excitation".  United States.  https://doi.org/10.1134/S1063782615100255.

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@article{osti_22469718,

  title        = {X-ray fluorescence analysis of Ge{sub 1–x}Se{sub x}, As{sub 1–x}Se{sub x}, and Ge{sub 1–x–y}As{sub y}Se{sub x} glasses using electronic excitation},

  author       = {Terukov, E. I. and Seregin, P. P., E-mail: ppseregin@mail.ru and Marchenko, A. V. and Zhilina, D. V. and Bobokhuzhaev, K. U.},

  abstractNote = {X-ray fluorescence analysis with fluorescence excitation by an electron beam with an energy of 30 kV is applied to determine the germanium, arsenic, and selenium contents in Ge{sub 1–x}Se{sub x}, As{sub 1–x}Se{sub x}, and Ge{sub 1–x–y}As{sub y}Se{sub x} glassy alloys. Using calibration dependences, the quantitative composition of the glasses is determined with an accuracy of ±0.0002 for parameters x and y in a surface layer ∼0.1 µm deep.},

  doi          = {10.1134/S1063782615100255},

  url          = {https://www.osti.gov/biblio/22469718},
  journal      = {Semiconductors},

  issn         = {1063-7826},

  number       = 10,

  volume       = 49,

  place        = {United States},

  year         = {Thu Oct 15 00:00:00 EDT 2015},

  month        = {Thu Oct 15 00:00:00 EDT 2015}

}

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