High-frequency detection of the formation and stabilization of a radiation-induced defect cluster in semiconductor structures
- Lobachevsky Nizhny Novgorod State University (Russian Federation)
The processes of the formation and stabilization of a radiation-induced defect cluster upon the arrival of a fast neutron to the space-charge region of a semiconductor diode are analyzed. The current pulse formed by secondary electrons is calculated and the spectrum of the signal generated by the diode (detector) under the action of an instantaneous neutron flux of the fission spectrum is determined. The possibility of experimental detection of the picosecond radiation-induced transition processes is discussed.
- OSTI ID:
- 22469667
- Journal Information:
- Semiconductors, Vol. 49, Issue 12; Other Information: Copyright (c) 2015 Pleiades Publishing, Ltd.; Country of input: International Atomic Energy Agency (IAEA); ISSN 1063-7826
- Country of Publication:
- United States
- Language:
- English
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