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Title: Study of modification methods of probes for critical-dimension atomic-force microscopy by the deposition of carbon nanotubes

The results of an experimental study of the modification of probes for critical-dimension atomicforce microscopy (CD-AFM) by the deposition of carbon nanotubes (CNTs) to improve the accuracy with which the surface roughness of vertical walls is determined in submicrometer structures are presented. Methods of the deposition of an individual CNT onto the tip of an AFM probe via mechanical and electrostatic interaction between the probe and an array of vertically aligned carbon nanotubes (VACNTs) are studied. It is shown that, when the distance between the AFM tip and a VACNT array is 1 nm and the applied voltage is within the range 20–30 V, an individual carbon nanotube is deposited onto the tip. On the basis of the results obtained in the study, a probe with a carbon nanotube on its tip (CNT probe) with a radius of 7 nm and an aspect ratio of 1:15 is formed. Analysis of the CNT probe demonstrates that its use improves the resolution and accuracy of AFM measurements, compared with the commercial probe, and also makes it possible to determine the roughness of the vertical walls of high-aspect structures by CD-AFM. The results obtained can be used to develop technological processes for themore » fabrication and reconditioning of special AFM probes, including those for CD-AFM, and procedures for the interoperational express monitoring of technological process parameters in the manufacturing of elements for micro- and nanoelectronics and micro- and nanosystem engineering.« less
Authors:
 [1] ;  [2] ; ; ; ; ;  [1]
  1. Southern Federal University, Institute for Nanotechnologies, Electronics, and Electronic Equipment Engineering (Russian Federation)
  2. NT-MDT (Russian Federation)
Publication Date:
OSTI Identifier:
22469656
Resource Type:
Journal Article
Resource Relation:
Journal Name: Semiconductors; Journal Volume: 49; Journal Issue: 13; Other Information: Copyright (c) 2015 Pleiades Publishing, Ltd.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
77 NANOSCIENCE AND NANOTECHNOLOGY; ACCURACY; ASPECT RATIO; ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; COMPARATIVE EVALUATIONS; DEPOSITION; ELECTRIC POTENTIAL; FABRICATION; MONITORING; NANOELECTRONICS; PROBES; RESOLUTION; ROUGHNESS; SURFACES