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Title: Correlation between Pd metal thickness and thermally stable perpendicular magnetic anisotropy features in [Co/Pd]{sub n} multilayers at annealing temperatures up to 500 °C

We examine highly stable perpendicular magnetic anisotropy (PMA) features of [Co/Pd]{sub 10} multilayers (MLs) versus Pd thickness at various ex-situ annealing temperatures. Thermally stable PMA characteristics were observed up to 500 °C, confirming the suitability of these systems for industrial applications at this temperature. Experimental observations suggest that the choice of equivalent Co and Pd layer thicknesses in a ML configuration ensures thermally stable PMA features, even at higher annealing temperatures. X-ray diffraction patterns and cross-sectional transmission electron microscopy images were obtained to determine thickness, post-annealing PMA behavior, and to explore the structural features that govern these findings.
Authors:
; ; ;  [1] ;  [2] ;  [3] ;  [1] ;  [4]
  1. Novel Functional Materials and Devices Lab, The Research Institute for Natural Science, Department of Physics, Hanyang University, Seoul 133-791 (Korea, Republic of)
  2. Division of Nano-Scale Semiconductor Engineering, Hanyang University, Seoul 133-791 (Korea, Republic of)
  3. Nano Quantum Electronics Lab, Department of Electronics and Computer Engineering, Hanyang University, Seoul 133-791 (Korea, Republic of)
  4. (Korea, Republic of)
Publication Date:
OSTI Identifier:
22454462
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Advances; Journal Volume: 5; Journal Issue: 2; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ANISOTROPY; ANNEALING; LAYERS; METALS; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION