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Title: Image contrast reversals in contact resonance atomic force microscopy

Multiple image contrast inversions are observed along with the increase of modulation frequency for contact resonance atomic force microscopy (CR-AFM) imaging of a highly oriented pyrolytic graphite (HOPG) specimen. Analysis of the contact vibrational spectra indicates that the inversions can be attributed to structure-induced variations of tip-sample contact mechanics. Contact stiffness and damping at HOPG step edges exhibit significant increases relative to those in the flat regions. For quantitative evaluation of mechanical properties in CR-AFM, coupling effects of the surface geometry must be considered.
Authors:
; ;  [1]
  1. Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei, Anhui 230026 (China)
Publication Date:
OSTI Identifier:
22454450
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Advances; Journal Volume: 5; Journal Issue: 2; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ATOMIC FORCE MICROSCOPY; EVALUATION; FLEXIBILITY; GRAPHITE; RESONANCE; SPECTRA; SURFACES