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Title: Processing and structural properties of random oriented lead lanthanum zirconate titanate thin films

Highlights: • Pyrochlore phase crystallizes near the bottom film-electrode interface. • PLZT films show a non-uniform microstrain and crystallite size in depth profile. • Complex grainy structure leads to different elastic modulus at the nanoscale. - Abstract: Polycrystalline lead lanthanum zirconate titanate (PLZT) thin films have been prepared by a polymeric chemical route to understand the mechanisms of phase transformations and map the microstructure and elastic properties at the nanoscale in these films. X-ray diffraction, atomic force microscopy (AFM) and ultrasonic force microscopy (UFM) have been used as investigative tools. On one side, PLZT films with mixed-phase show that the pyrochlore phase crystallizes predominantly in the bottom film-electrode interface while a pure perovskite phase crystallizes in top film surface. On the contrary, pyrochlore-free PLZT films show a non-uniform microstrain and crystallite size along the film thickness with a heterogeneous complex grainy structure leading to different elastic properties at nanoscale.
Authors:
 [1] ; ;  [1] ;  [2] ;  [2] ;  [3] ;  [2] ; ;  [2] ;  [3]
  1. Faculdade de Engenharia de Ilha Solteira, UNESP – Univ. Estadual Paulista, Departamento de Física e Química, 15385-000 Ilha Solteira, SP (Brazil)
  2. CNR, INO UOS A Gozzini, Area Ric Pisa S Cataldo, I-56124 Pisa (Italy)
  3. (Italy)
Publication Date:
OSTI Identifier:
22420736
Resource Type:
Journal Article
Resource Relation:
Journal Name: Materials Research Bulletin; Journal Volume: 61; Other Information: Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ATOMIC FORCE MICROSCOPY; COMPLEXES; ELASTICITY; ELECTRODES; INTERFACES; LANTHANUM; MICROSTRUCTURE; NANOSTRUCTURES; PEROVSKITE; PHASE TRANSFORMATIONS; PLZT; POLYCRYSTALS; PYROCHLORE; RANDOMNESS; SURFACES; SYNTHESIS; THIN FILMS; X-RAY DIFFRACTION