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Title: Investigation of structural, optical, electrical and dielectric properties of catalytic sprayed hausmannite thin film

Hausmannite Mn{sub 3}O{sub 4} thin film have been synthesized using spray pyrolysis method. These films are characterized using X-ray diffraction (XRD), atomic force microscope AFM, UV–vis–NIR spectroscopy and impedance spectroscopy. XRD study confirms the tetragonal structure of the as-deposited films with lattice parameters, a = 5.1822 Å and c = 9.4563 Å and a grain size of about 56 nm. UV–vis–NIR spectroscopy was further used to estimate optical constants such as extinction coefficient, refractive index, band gap and Urbach energy. Moreover, impedance spectroscopy analysis was employed to estimate electrical and dielectrical properties of the sprayed thin films. The activation energy values deduced from DC conductivity and relaxation frequency were almost the same, revealing that the transport phenomena is thermally activated by hopping between localized states. The AC conductivity is found to be proportional to ω{sup s}. The temperature dependence of the AC conductivity and the frequency exponent, s was reasonably well interpreted in terms of the correlated barrier-hopping CBH model. The dielectric properties were sensitive to temperature and frequency. The study of the electrical modulus indicated that the charge carrier was localized. Experimental results concerning optical constants as Urbach energy, dielectric constant, electric modulus and AC and DC conductivity weremore » discussed in terms of the hopping model as suggested by Elliott.« less
Authors:
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Publication Date:
OSTI Identifier:
22420729
Resource Type:
Journal Article
Resource Relation:
Journal Name: Materials Research Bulletin; Journal Volume: 60; Other Information: Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ACTIVATION ENERGY; ATOMIC FORCE MICROSCOPY; CHARGE CARRIERS; CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; EPITAXY; GRAIN SIZE; IMPEDANCE; INFRARED SPECTRA; LATTICE PARAMETERS; MANGANESE OXIDES; PERMITTIVITY; REFRACTIVE INDEX; RELAXATION; SEMICONDUCTOR MATERIALS; TEMPERATURE DEPENDENCE; THIN FILMS; X-RAY DIFFRACTION