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Title: Crystallization, densification and dielectric properties of CaO–MgO–Al{sub 2}O{sub 3}–SiO{sub 2} glass with ZrO{sub 2} as nucleating agent

SEM micrographs for the pure CaO–MgO–Al{sub 2}O{sub 3}–SiO{sub 2} glass sintered at 850–1000 °C (a) 850 °C, (b) 900 °C, (c) 950 °C, (d) 1000 °C. - Highlights: • ZrO{sub 2} effects on the crystallization of LTCC glass system were investigated. • ZrO{sub 2} effects on the dielectric properties of LTCC glass system were investigated. • LTCC with a dielectric constant of 6.65 and a low dielectric loss can be obtained. - Abstract: The zirconium oxide effects on the crystallization and dielectric properties of CaO–MgO–Al{sub 2}O{sub 3}–SiO{sub 2} (CMAS) glass were investigated. The results showed that phyllosiloxide and anorthite crystallites were observed in sequence during sintering. For glass added with 8 wt% ZrO{sub 2}, homogeneously dispersed tetragonal ZrO{sub 2} crystallites were observed at 850 °C. The as-prepared CMAS glass–ceramics exhibited a dielectric constant of about 6–7 and a dielectric loss below 0.005 at 100 MHz. The dielectric properties of CMAS glass with 8 wt% ZrO{sub 2} sintered at 850 °C show a low dielectric constant of 6.65 and a dielectric loss tangent of about 2.5 × 10{sup −3}, which provides a promising candidate for LTCC applications.
Authors:
 [1] ;  [2] ;  [1]
  1. Department of Resources Engineering, Particulate Materials Research Center, National Cheng Kung University, Tainan 70101, Taiwan (China)
  2. National United University, Department of Materials Science and Engineering, Miaoli 36003, Taiwan (China)
Publication Date:
OSTI Identifier:
22420714
Resource Type:
Journal Article
Resource Relation:
Journal Name: Materials Research Bulletin; Journal Volume: 60; Other Information: Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ALUMINIUM OXIDES; ANORTHITE; CALCIUM OXIDES; CERAMICS; CRYSTALLIZATION; DIELECTRIC MATERIALS; GLASS; MAGNESIUM OXIDES; MHZ RANGE; MICROSTRUCTURE; PERMITTIVITY; SCANNING ELECTRON MICROSCOPY; SILICON OXIDES; SINTERING; ZIRCONIUM OXIDES