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Title: Structural, optical and waveguiding properties improvement of SiO{sub 2}/TiO{sub 2} Bragg reflectors processed by the sol–gel method under the effect of Ni-doped TiO{sub 2} and annealing duration

Highlights: • The formation of anatase phase only, whatever are Ni content and annealing duration. • Transmission and PL spectra redshifted with Ni content and annealing duration. • PL lowering with Ni content is due to the recombination rate of electron–hole reduction. • Annealing duration increases the recombination rate and then the PL intensity rises. • Increasing Ni content improves waveguiding properties and then two TE modes appear. - Abstract: We investigated the nickel doped TiO{sub 2} layer and annealing duration effects on SiO{sub 2}/TiO{sub 2} Bragg reflectors. The films crystallize in pure anatase phase whatever is the Ni content and the annealing duration. In UV–vis-NIR analyses, variations of width, position and transmission coefficient of the stop-band were observed. The PL spectra red-shifted when the Ni content and annealing duration increased. As the annealing duration increases, an additional sharp emission peak appears around 867 nm, indicating a reduced number of defects. As Ni content increased, the M-lines spectroscopy shows two transverse electric polarization guided modes TE{sub 0} and TE{sub 1}, which indicates a decreased refractive index and an increased film thickness.
Authors:
 [1] ;  [1] ;  [1] ; ;  [2]
  1. Laboratoire de Céramique, Université Constantine 1, Route Aïn El-Bey (25000) Constantine (Algeria)
  2. Institut Jean Lamour, CNRS UMR 7198 - Nancy-Université, B.P. 239, 54506 Vandoeuvre-lès-Nancy (France)
Publication Date:
OSTI Identifier:
22420566
Resource Type:
Journal Article
Resource Relation:
Journal Name: Materials Research Bulletin; Journal Volume: 57; Other Information: Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ANNEALING; BRAGG REFLECTION; CRYSTAL STRUCTURE; DOPED MATERIALS; EMISSION SPECTRA; FILMS; HOLES; LAYERS; NICKEL; PHOTOLUMINESCENCE; POLARIZATION; RAMAN SPECTROSCOPY; RECOMBINATION; RED SHIFT; REFRACTIVE INDEX; SILICA; SILICON OXIDES; SOL-GEL PROCESS; TITANIUM OXIDES