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Title: Morphology and magneto-transport properties of electron doped La{sub 0.85}Te{sub 0.15}MnO{sub 3} thin film deposited on LaAlO{sub 3} substrate

Graphical abstract: Resistivity versus temperature plots of La{sub 0.85}Te{sub 0.15}MnO{sub 3} thin film under the applied magnetic field of 0 T, 5 T and 8 T. - Highlights: • La{sub 0.85}Te{sub 0.15}MnO{sub 3} manganite thin film is deposited on LaAlO{sub 3} using PLD technique. • Film is deposited at 750 °C, and is highly crystalline, single phase and c-axis oriented. • The film consists of grains with an average diameter of 60 nm. • Resistivity plots display double insulator-metal transitions. • XPS results confirm the electron doped (n-type) nature of the film. - Abstract: We report the structural, electronic transport and X-ray photoemission spectroscopic study of 100 nm thin film of La{sub 0.85}Te{sub 0.15}MnO{sub 3} grown on (0 0 1) LaAlO{sub 3} single crystal substrate by pulsed laser deposition. XRD results confirm that the film has good crystalline quality, single phase, and has a c-axis orientation. The atomic force microscopic (AFM) results showed that the film consists of grains with an average diameter of 60 nm. The resistivity measurement showed double insulator-metal transitions in absence and as well as in presence of the magnetic field. The resistivity peaks are ascribed to the intrinsic contribution of LTMO film and the tunnellingmore » of spin-polarized electrons at grain boundaries. X-ray photoemission spectroscopy measurements suggest that Te ions are in the Te{sup 4+} state, while the Mn ions are forced to stay in the Mn{sup 2+} and Mn{sup 3+} valence state.« less
Authors:
 [1] ;  [1] ;  [2]
  1. Department of Physics, Aligarh Muslim University, Aligarh 202002, (U.P) (India)
  2. Department of Physics, University of Pune, Ganeshkhind, Pune 411007 (India)
Publication Date:
OSTI Identifier:
22420547
Resource Type:
Journal Article
Resource Relation:
Journal Name: Materials Research Bulletin; Journal Volume: 57; Other Information: Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ALUMINATES; ATOMIC FORCE MICROSCOPY; DOPED MATERIALS; ENERGY BEAM DEPOSITION; GRAIN BOUNDARIES; LANTHANUM COMPOUNDS; LASER RADIATION; MAGNETIC FIELDS; MANGANATES; MONOCRYSTALS; PHASE TRANSFORMATIONS; PHOTOEMISSION; PULSED IRRADIATION; SPIN ORIENTATION; SUBSTRATES; TELLURIUM COMPOUNDS; THIN FILMS; TUNNEL EFFECT; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY