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Title: Study of Ga incorporation in glassy arsenic selenides by high-resolution XPS and EXAFS

Effect of Ga addition on the structure of vitreous As{sub 2}Se{sub 3} is studied using high-resolution X-ray photoelectron spectroscopy and extended X-ray absorption fine structure techniques. The “8-N” rule is shown to be violated for Ga atoms and, possibly, for certain number of As atoms. On the contrary, Se keeps its 2-fold coordination according to “8-N” rule in the amorphous phase throughout all the compositions. Crystalline inclusions appear in the amorphous structure of the investigated glasses at Ga concentrations greater than 3 at. %. These inclusions are presumably associated with Ga{sub 2}Se{sub 3} crystallites and transition phases/defects formed at the boundaries of these crystallites and host amorphous matrix. The existence of Ga–As and Se–Se bonds in the samples with higher Ga content is supported by present studies.
Authors:
 [1] ;  [2] ;  [3] ; ; ;  [2] ;  [4] ;  [5]
  1. Department of Physics and Astronomy, Austin Peay State University, Clarksville, Tennessee 37044 (United States)
  2. Equipe Verres et Céramiques UMR-CNRS 6226, Université de Rennes 1, 35042 Rennes Cedex (France)
  3. (Ukraine)
  4. Center for Microelectronics and Nanotechnology, University of Rzeszow, 1, Pigonia Str., 35-310 Rzeszow (Poland)
  5. Department of Materials Science and Engineering, Lehigh University, 5 East Packer Avenue, Bethlehem, Pennsylvania 18015-3195 (United States)
Publication Date:
OSTI Identifier:
22415773
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Chemical Physics; Journal Volume: 142; Journal Issue: 18; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; ABSORPTION; ABSORPTION SPECTROSCOPY; AMORPHOUS STATE; ARSENIC SELENIDES; ATOMS; CHEMICAL BONDS; CONCENTRATION RATIO; FINE STRUCTURE; GALLIUM SELENIDES; GLASS; MATRIX MATERIALS; PHASE TRANSFORMATIONS; RESOLUTION; X-RAY PHOTOELECTRON SPECTROSCOPY; X-RAY SPECTROSCOPY