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Title: High compositional homogeneity of CdTe{sub x}Se{sub 1−x} crystals grown by the Bridgman method

We obtained high-quality CdTe{sub x}Se{sub 1−x} (CdTeSe) crystals from ingots grown by the vertical Bridgman technique. The compositional uniformity of the ingots was evaluated by X-ray fluorescence at BNL’s National Synchrotron Light Source X27A beam line. The compositional homogeneity was highly uniform throughout the ingot, and the effective segregation coefficient of Se was ∼1.0. This high uniformity offers potential opportunity to enhance the yield of the materials for both infrared substrate and radiation-detector applications, so greatly lowering the cost of production and also offering us the prospect to grow large-diameter ingots for use as large-area substrates and for producing higher efficiency gamma-ray detectors. The concentration of secondary phases was found to be much lower, by eight- to ten fold compared to that of conventional Cd{sub x}Zn{sub 1−x}Te (CdZnTe or CZT)
Authors:
; ; ; ; ; ; ; ;  [1] ; ;  [1] ;  [2]
  1. Brookhaven National Laboratory, Upton, New York 11973 (United States)
  2. (Korea, Republic of)
Publication Date:
OSTI Identifier:
22415251
Resource Type:
Journal Article
Resource Relation:
Journal Name: APL materials; Journal Volume: 3; Journal Issue: 2; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; BRIDGMAN METHOD; CADMIUM SELENIDES; CADMIUM TELLURIDES; COMPARATIVE EVALUATIONS; CONCENTRATION RATIO; CRYSTALS; GAMMA RADIATION; RADIATION DETECTORS; SEGREGATION; SUBSTRATES; X-RAY FLUORESCENCE ANALYSIS; ZINC TELLURIDES