In-situ extended X-ray absorption fine structure study of electrostriction in Gd doped ceria
- Department of Materials and Interfaces, Weizmann Institute of Science, 234 Herzl Street, Rehovot 76100 (Israel)
Studying electric field-induced structural changes in ceramics is challenging due to the very small magnitude of the atomic displacements. We used differential X-ray absorption spectroscopy, an elementally specific and spatially sensitive method, to detect such changes in Gd-doped ceria, recently shown to exhibit giant electrostriction. We found that the large electrostrictive stress generation can be associated with a few percent of unusually short Ce-O chemical bonds that change their length and degree of order under an external electric field. The remainder of the lattice is reduced to the role of passive spectator. This mechanism is fundamentally different from that in electromechanically active materials currently in use.
- OSTI ID:
- 22415202
- Journal Information:
- Applied Physics Letters, Vol. 106, Issue 4; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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In-situ extended X-ray absorption fine structure study of electrostriction in Gd doped ceria
In-situ Extended X-ray Absorption Fine Structure Study of Electrostriction in Gd Doped Ceria