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Title: Characterization of bismuth nanospheres deposited by plasma focus device

A new method for producing thin layer of bismuth nanospheres based on the use of low energy plasma focus device is demonstrated. Various techniques such as scanning electron microscopy, Rutherford backscattering spectroscopy, X-ray diffraction, X-ray photoelectron spectroscopy, and Raman spectroscopy have been used to characterize the morphology and the composition of the nanospheres. Experimental parameters may be adjusted to favour the formation of bismuth nanospheres instead of microspheres. Therefore, the formation of large surface of homogeneous layer of bismuth nanospheres with sizes of below 100 nm can be obtained. The natural snowball phenomenon is observed to be reproduced in nanoscale where spheres roll over the small nanospheres and grow up to bigger sizes that can reach micro dimensions. The comet-like structure, a reverse phenomenon to snowball is also observed.
Authors:
 [1] ; ;  [2] ;  [3]
  1. IBA Laboratory, Chemistry Department, Atomic Energy Commission of Syria, P.O. Box 6091, Damascus (Syrian Arab Republic)
  2. Physics Department, Atomic Energy Commission of Syria, P.O. Box 6091, Damascus (Syrian Arab Republic)
  3. Chemistry Department, Atomic Energy Commission of Syria, P.O. Box 6091, Damascus (Syrian Arab Republic)
Publication Date:
OSTI Identifier:
22413085
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 117; Journal Issue: 6; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; BISMUTH; ELECTRON MICROSCOPY; LAYERS; MICROSPHERES; MORPHOLOGY; NANOSTRUCTURES; PLASMA FOCUS DEVICES; RAMAN SPECTROSCOPY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SPHERES; SURFACES; THIN FILMS; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY