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Title: Model for transport and reaction of defects and carriers within displacement cascades in gallium arsenide

Abstract

A model is presented for recombination of charge carriers at evolving displacement damage in gallium arsenide, which includes clustering of the defects in atomic displacement cascades produced by neutron or ion irradiation. The carrier recombination model is based on an atomistic description of capture and emission of carriers by the defects with time evolution resulting from the migration and reaction of the defects. The physics and equations on which the model is based are presented, along with the details of the numerical methods used for their solution. The model uses a continuum description of diffusion, field-drift and reaction of carriers, and defects within a representative spherically symmetric cluster of defects. The initial radial defect profiles within the cluster were determined through pair-correlation-function analysis of the spatial distribution of defects obtained from the binary-collision code MARLOWE, using recoil energies for fission neutrons. Properties of the defects are discussed and values for their parameters are given, many of which were obtained from density functional theory. The model provides a basis for predicting the transient response of III-V heterojunction bipolar transistors to displacement damage from energetic particle irradiation.

Authors:
 [1]
  1. Radiation-Solid Interactions Department 1111, Sandia National Laboratories, P.O. Box 5800, Albuquerque, New Mexico 87185-1056 (United States)
Publication Date:
OSTI Identifier:
22413023
Resource Type:
Journal Article
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 117; Journal Issue: 4; Other Information: (c) 2015 U.S. Government; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0021-8979
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ATOMIC DISPLACEMENTS; CHARGE CARRIERS; CORRELATION FUNCTIONS; CRYSTAL DEFECTS; DENSITY FUNCTIONAL METHOD; DIFFUSION; FISSION NEUTRONS; GALLIUM ARSENIDES; HETEROJUNCTIONS; IRRADIATION; NEUTRON FLUENCE; RECOMBINATION; SPATIAL DISTRIBUTION

Citation Formats

Wampler, William R., E-mail: wrwampl@sandia.gov, and Myers, Samuel M. Model for transport and reaction of defects and carriers within displacement cascades in gallium arsenide. United States: N. p., 2015. Web. doi:10.1063/1.4906104.
Wampler, William R., E-mail: wrwampl@sandia.gov, & Myers, Samuel M. Model for transport and reaction of defects and carriers within displacement cascades in gallium arsenide. United States. https://doi.org/10.1063/1.4906104
Wampler, William R., E-mail: wrwampl@sandia.gov, and Myers, Samuel M. 2015. "Model for transport and reaction of defects and carriers within displacement cascades in gallium arsenide". United States. https://doi.org/10.1063/1.4906104.
@article{osti_22413023,
title = {Model for transport and reaction of defects and carriers within displacement cascades in gallium arsenide},
author = {Wampler, William R., E-mail: wrwampl@sandia.gov and Myers, Samuel M.},
abstractNote = {A model is presented for recombination of charge carriers at evolving displacement damage in gallium arsenide, which includes clustering of the defects in atomic displacement cascades produced by neutron or ion irradiation. The carrier recombination model is based on an atomistic description of capture and emission of carriers by the defects with time evolution resulting from the migration and reaction of the defects. The physics and equations on which the model is based are presented, along with the details of the numerical methods used for their solution. The model uses a continuum description of diffusion, field-drift and reaction of carriers, and defects within a representative spherically symmetric cluster of defects. The initial radial defect profiles within the cluster were determined through pair-correlation-function analysis of the spatial distribution of defects obtained from the binary-collision code MARLOWE, using recoil energies for fission neutrons. Properties of the defects are discussed and values for their parameters are given, many of which were obtained from density functional theory. The model provides a basis for predicting the transient response of III-V heterojunction bipolar transistors to displacement damage from energetic particle irradiation.},
doi = {10.1063/1.4906104},
url = {https://www.osti.gov/biblio/22413023}, journal = {Journal of Applied Physics},
issn = {0021-8979},
number = 4,
volume = 117,
place = {United States},
year = {Wed Jan 28 00:00:00 EST 2015},
month = {Wed Jan 28 00:00:00 EST 2015}
}