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Title: Effect of thickness on the stress and magnetoelectric coupling in bilayered Pb(Zr{sub 0.52}Ti{sub 0.48})O{sub 3}-CoFe{sub 2}O{sub 4} films

Magnetoelectric bilayered Pb(Zr{sub 0.52}Ti{sub 0.48})O{sub 3}-CoFe{sub 2}O{sub 4}(PZT-CFO) films with different PZT thicknesses were grown on (111)Pt/Ti/SiO{sub 2}/Si substrates using chemical solution spin-coating. Structural characterization by X-ray diffraction and electron microscopy shows pure phases and well-defined interfaces between the PZT and CFO films. The CFO-PZT-substrate structure effectively alleviates the substrate clamping effect for the CFO layer, showing appreciable magnetoelectric responses in the composite films. Both the direct magnetoelectric effect and the magnetic field-induced Raman shifts in the A{sub 1}(TO{sub 1}) soft mode of PZT demonstrate the magnetic-mechanical-electric coupling in the films. The results also indicate that with a constant CFO layer thickness, the thickness of the PZT layer plays an important role in the stress relaxation and strong magnetoelectric coupling. The coupling could be further enhanced by increasing the CFO thickness, optimizing the volume (thickness) fraction of the PZT thickness, and releasing the clamping effect from the substrate.
Authors:
 [1] ; ; ;  [2] ;  [3]
  1. State Key Laboratory of Mechanics and Control of Mechanical Structures, College of Aerospace Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing 210016 (China)
  2. School of Materials Science and Engineering, State Key Lab of New Ceramics and Fine Processing, Tsinghua University, Beijing 100084 (China)
  3. State Key Lab of Electronic Thin Films and Integrated Devices, School of Microelectronics and Solid-State Electronics, University of Electronic Science and Technology of China, Chengdu, Sichuan 610054 (China)
Publication Date:
OSTI Identifier:
22412996
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 117; Journal Issue: 4; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; COBALT OXIDES; COUPLING; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; FERRITES; FILMS; INTERFACES; LAYERS; MAGNETIC FIELDS; MAGNETIC PROPERTIES; PLATINUM; PZT; SILICON; SILICON OXIDES; SPIN-ON COATING; STRESS RELAXATION; SUBSTRATES; TITANIUM; X-RAY DIFFRACTION