Hard x-ray photoelectron spectroscopy using an environmental cell with silicon nitride membrane windows
- Exploratory Research for Advanced Technology, Japan Science and Technology Agency, Nakajima Designer Nanocluster Assembly Project, 3-2-1 Sakado, Takatsu-ku, Kawasaki 213-0012 (Japan)
- Japan Synchrotron Radiation Research Institute (JASRI)/SPring-8, 1-1-1 Kouto, Sayo, Hyogo 679-5198 (Japan)
We applied hard x-ray photoelectron spectroscopy (HAXPES) to a sample under ambient pressure conditions using an environmental cell with an approximately 24 nm-thick SiN{sub x} membrane window. As a model chemical substance, europium (II) iodide (EuI{sub 2}) sealed in the cell with argon gas was investigated with HAXPES to identify the chemical species present inside the cell. The optical and morphological properties of the sample within the cell were measured with optical and fluorescent microscopy, scanning electron microscopy, cathodoluminescence, and energy dispersive x-ray spectrometry. We confirmed the effectiveness of the gas barrier properties of the cell with the SiN{sub x} window and demonstrated its applicability to various other optical and electron measurements as well as HAXPES.
- OSTI ID:
- 22412948
- Journal Information:
- Journal of Applied Physics, Vol. 117, Issue 23; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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