skip to main content

Title: Hard x-ray photoelectron spectroscopy using an environmental cell with silicon nitride membrane windows

We applied hard x-ray photoelectron spectroscopy (HAXPES) to a sample under ambient pressure conditions using an environmental cell with an approximately 24 nm-thick SiN{sub x} membrane window. As a model chemical substance, europium (II) iodide (EuI{sub 2}) sealed in the cell with argon gas was investigated with HAXPES to identify the chemical species present inside the cell. The optical and morphological properties of the sample within the cell were measured with optical and fluorescent microscopy, scanning electron microscopy, cathodoluminescence, and energy dispersive x-ray spectrometry. We confirmed the effectiveness of the gas barrier properties of the cell with the SiN{sub x} window and demonstrated its applicability to various other optical and electron measurements as well as HAXPES.
Authors:
;  [1] ;  [2] ; ; ;  [3] ;  [1] ;  [2] ;  [4]
  1. Exploratory Research for Advanced Technology, Japan Science and Technology Agency, Nakajima Designer Nanocluster Assembly Project, 3-2-1 Sakado, Takatsu-ku, Kawasaki 213-0012 (Japan)
  2. (Japan)
  3. Japan Synchrotron Radiation Research Institute (JASRI)/SPring-8, 1-1-1 Kouto, Sayo, Hyogo 679-5198 (Japan)
  4. (KiPAS), Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama 223-8522 (Japan)
Publication Date:
OSTI Identifier:
22412948
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 117; Journal Issue: 23; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; APPROXIMATIONS; CATHODOLUMINESCENCE; DIFFUSION BARRIERS; ELECTRONS; EUROPIUM IODIDES; FLUORESCENCE; HARD X RADIATION; MEMBRANES; PHOTOELECTRON SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICON NITRIDES; X-RAY SPECTROSCOPY