β phase instability in poly(vinylidene fluoride/trifluoroethylene) thin films near β relaxation temperature
- National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Yu Tian Road 500, Shanghai 200083 (China)
The β phase stability in poly(vinylidene fluoride/trifluoroethylene) [P(VDF-TrFE)] thin films was studied below 300 K using X-ray diffraction and polarization-electric-field (P-E) hysteresis loops measurements. On as-grown samples, an irreversible partial order-disorder transformation at T{sub β} ∼ 250 K, namely, the β relaxation temperature, was evidenced by the appearance of an additional X-Ray diffraction peak above T{sub β} as well as changes on the P-E loops on heating after the first cooling. This order-disorder-like transformation which is attributed to an all-trans order to helical disorder transition is suggested to take place in defect-rich regions like crystal-amorphous interphases and/or crystalline areas with randomly distributed TrFE defect-like units.
- OSTI ID:
- 22412763
- Journal Information:
- Applied Physics Letters, Vol. 106, Issue 9; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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