The role of the hole-extraction layer in determining the operational stability of a polycarbazole:fullerene bulk-heterojunction photovoltaic device

Journal Article · Mon Feb 16 00:00:00 EST 2015 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4909530· OSTI ID:22412664

Bovill, E.; Scarratt, N.; Griffin, J.; Buckley, A. R.; Yi, H.; Iraqi, A. ^[1]; Kingsley, J. W. ^[2]

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1. Department of Chemistry, University of Sheffield, Sheffield S3 7HF (United Kingdom)
2. Ossila Ltd., Kroto Innovation Centre, Broad Lane, Sheffield S3 7HQ (United Kingdom)

We have made a comparative study of the relative operational stability of bulk-heterojunction organic photovoltaic (OPV) devices utilising different hole transport layers (HTLs). OPV devices were fabricated based on a blend of the polymer PCDTBT with the fullerene PC{sub 70}BM, and incorporated the different HTL materials PEDOT:PSS, MoO{sub x} and V{sub 2}O{sub 5}. Following 620 h of irradiation by light from a solar simulator, we find that devices using the PEDOT:PSS HTL retained the highest efficiency, having a projected T{sub 80} lifetime of 14 500 h.

• OSTI ID: 22412664
• Journal Information: Applied Physics Letters, Vol. 106, Issue 7; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
FULLERENES
HETEROJUNCTIONS
HOLES
IRRADIATION
LAYERS
LIFETIME
ORGANIC POLYMERS
PHOTOVOLTAIC EFFECT
POLYMERS
SOLAR SIMULATORS
VANADIUM OXIDES
VISIBLE RADIATION