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Title: High-resolution electron microscopy in spin pumping NiFe/Pt interfaces

In order to understand the effect of the interface on the spin pumping and magnetic proximity effects, high resolution transmission electron microscopy and ferromagnetic resonance (FMR) were used to analyze Py/Pt bilayer and Pt/Py/Pt trilayer systems. The samples were deposited by dc magnetron sputtering at room temperature on Si (001) substrates. The Py layer thickness was fixed at 12 nm in all the samples and the Pt thickness was varied in a range of 0–23 nm. A diffusion zone of approximately 8 nm was found in the Py/Pt interfaces and confirmed by energy dispersive X-ray microanalysis. The FMR measurements show an increase in the linewidth and a shift in the ferromagnetic resonance field, which reach saturation.
Authors:
; ; ; ; ; ; ; ;  [1] ; ; ;  [2]
  1. Centro de Investigación en Materiales Avanzados, S.C., Miguel de Cervantes 120, Complejo Industrial Chihuahua, Chihuahua 31109 (Mexico)
  2. Departamento de Física, Universidade Federal de Pernambuco, 50670-901 Recife, PE (Brazil)
Publication Date:
OSTI Identifier:
22410112
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 117; Journal Issue: 17; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; APPROXIMATIONS; DIFFUSION; FERROMAGNETIC RESONANCE; INTERFACES; INTERMETALLIC COMPOUNDS; IRON; LAYERS; MICROANALYSIS; NICKEL; PLATINUM; RESOLUTION; SILICON; SPIN; SPUTTERING; SUBSTRATES; TEMPERATURE RANGE 0273-0400 K; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY; X RADIATION