Low temperature growth of Co{sub 2}MnSi films on diamond semiconductors by ion-beam assisted sputtering
- Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603 (Japan)
High quality Schottky junctions using Co{sub 2}MnSi/diamond heterostructures were fabricated. Low temperature growth at ∼300–400 °C by using ion-beam assisted sputtering (IBAS) was necessary to obtain abrupt Co{sub 2}MnSi/diamond interfaces. Only the Co{sub 2}MnSi films formed at ∼300–400 °C showed both saturation magnetization comparable to the bulk values and large negative anisotropic magnetoresistance, which suggests half-metallic nature of the Co{sub 2}MnSi films, of ∼0.3% at 10 K. Schottky junctions formed using the Co{sub 2}MnSi films showed clear rectification properties with rectification ratio of more than 10{sup 7} with Schottky barrier heights of ∼0.8 eV and ideality factors (n) of ∼1.2. These results indicate that Co{sub 2}MnSi films formed at ∼300–400 °C by IBAS are a promising spin source for spin injection into diamond semiconductors.
- OSTI ID:
- 22410102
- Journal Information:
- Journal of Applied Physics, Vol. 117, Issue 17; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ANISOTROPY
COBALT COMPOUNDS
COMPARATIVE EVALUATIONS
DIAMONDS
ELECTRIC CONTACTS
FILMS
HETEROJUNCTIONS
INTERFACES
ION BEAMS
MAGNETIZATION
MAGNETORESISTANCE
MANGANESE SILICIDES
SEMICONDUCTOR JUNCTIONS
SEMICONDUCTOR MATERIALS
SPIN
SPUTTERING
TEMPERATURE DEPENDENCE